v0.31.0

Breaking

• The 74 deprecated exports are removed: the 73 deprecated in 0.30.0 (the low-level drawing
  pipeline, the chart-data builders, the region builders and the helpers exported by accident)
  and renderFindingsReportHtml, deprecated in 0.30.3. Each named its replacement in a console
  notice. Upgrading lists every name with
  what to use instead; the main replacements:

  Removed	Use instead
  resolveBinColors, getBinColorScheme	binColorsForMaps(results), or getBinColors() on a map or gallery controller
  valueToViridis, valueToGreyscale, getValueColorScheme	resolveValueColorFn(name, reversed)
  buildYieldData, buildYieldDataCombined	lotYieldSeries on analyzeWaferLot's result
  buildBinParetoData, buildBinClusterData	stats.hardBinCounts, stats.softBinCounts
  buildCapabilityData, buildTestBoxplotData, buildTestTrendData, trendCentre	stats.capability, stats.perTestStats, perWaferTestStats (with computePerTestStats)
  buildTestPassRateData, hasJudgeableTests, computeFunctionalYield	stats.testSpecYield, stats.testFlagYield, stats.functionalYield
  buildRegionYieldData, buildRingRegions, buildQuadrantRegions, classifyDie, getRingLabel	stats.regionYield
  classifyPattern	stats.spatialPattern
  renderSummaryReportHtml, renderLotSummaryReportHtml, renderFindingsReportHtml	renderWaferReportHtml(result, summary?), renderLotReportHtml(results)
  openHtmlReport	openReportModal(html), setReportOpener
  createWafer, generateDies, clipDiesToWafer	buildWaferMap({ layout: true, waferConfig, dieConfig })
  aggregateValues, aggregateBinCounts, getUniqueBins	buildWaferMap's lotStack
  STANDARD_WAFER_DIAMETERS_MM, resolveGridPitch	buildWaferMap's standardDiameters; each die's width/height
  getDieTestValue, isParametricTest, isPositionedDie, metadataCategoricalValue	die.testValues?.[n], testType !== 'F', hasPosition, metadataDisplayValue

  buildView, toCanvas, buildHoverText, buildMapTitle, the transform and affine*
  helpers, the histogram, scatter and correlation data builders, the sector, reticle and
  test-site region builders, parseRegionKey, contrastTextColor, dieHasTestData,
  resolveMetadataColumns, discoverDieMetadataKeys, buildDieListSection and
  DEFAULT_FACET_CURATION have no public replacement: the renderers and the analysis do that
  work themselves.

• 63 types that belonged only to removed functions are removed with them, among them the
  chart-data types, the draw-list types (View, ViewOptions, ViewRect and the rest),
  PitchResult, ToCanvasResult, HitTarget, DieListOptions and the geometry inputs
  WaferSpec, DieSpec and ReticleSpec. Upgrading lists them all. PlotMode stays.

• buildWaferMap takes one argument. The second (WaferMapOptions) set only the starting
  result.plotMode, which the Web Worker never passed, so a build on and off the main thread
  could start in different modes. Set the starting mode with renderWaferMap's or
  renderWaferGallery's viewOptions.plotMode.

• downloadFilename is a prefix for every saved file, on renderWaferMap and
  renderWaferGallery: <downloadFilename>_W05_hard-bin.png, <downloadFilename>_W05_die-list.csv.
  It applies to CSVs, charts, gallery cards and detached windows as well as the map's or gallery's
  PNG, which it no longer names outright. Parts the prefix already names are not repeated. A host
  that matched the exact name its onSaveImage receives should match on the prefix.

• Values outside the STDF V4 ranges are treated as missing. 0.30.4 reported them with the
  input-values-outside-stdf warning and used them as given; buildWaferMap now leaves them out,
  and the warning says what it did:

  • a bin outside 0–32767 or not a whole number: the die has no bin (so it is neither pass nor fail);
  • a coordinate outside ±32767 or not a whole number: the die has no position, in either axis;
  • a test number outside 0–4294967295: that test is left out of every die and of testDefs;
  • a test value that is not finite: that value is left out;
  • a site number outside 0–255: the die has no site;
  • a waferConfig.orientation other than 0, 90, 180 or 270 (or an equivalent such as −90): the
    map is built at 0. WaferConfig.orientation is typed 0 | 90 | 180 | 270.

  The caller's input objects are not modified. A derived test whose testNumber is outside
  0–4294967295 is dropped with a derived-test-invalid warning.

• WaferViewOptions.showPartialDies and isYieldEligibleDie's includePartial are removed.
  No map buildWaferMap builds has partial dies, so neither had anything to act on. A saved
  preference that still carries showPartialDies is ignored. Partial dies a host supplies
  itself are drawn in muted grey and always left out of yield.

Added

• Insights charts draw spec limits as well as test limits. The boxplot, histogram,
  wafer-to-wafer trend and scatter show a test's spec limits (specLow/specHigh, labelled
  LSL/USL, long dashes) beside its test limits (Lo/Hi limit, short dashes). When a test has
  both, a Limits choice (Test + spec, the default; Test limits; Spec limits; None) applies to
  all four charts. Labels that would overlap move to a second row, Axis includes limits
  covers every limit shown, and the scatter marks limits outside its plotted range at the edge,
  as the other charts do. The wafer map still judges pass/fail by the test limits.
• Chart gridlines are lighter (the border colour at 40% opacity), so the data and the limit
  lines stand out from the grid in every theme. The scatter draws its limits in the same amber
  as the other charts, and its limit labels sit on a panel-coloured backing where lines cross
  them.

Changed

• The data-and-stats layer is ~49 KB gzipped, from ~61 KB, with the removed exports gone.

Fixed

• Charts opened from a gallery card's right-click menu are saved under the card's lot and
  wafer, as they are from a single map.

Documentation

• New page, Upgrading: what to change
  for each breaking release, starting with 0.31.0.
• Every version has a GitHub release, created when its tag is pushed, with that version's
  changelog section as its notes.

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npm: @wafertools/wafermap@0.31.0 ·
Upgrading ·
What's New ·
Full changelog